Dr. S. R. Gowarikar, Chairman, Board of Governers, Technical Teachers Training Institute, Chandigarh is addressing the audience as Chief Guest at the time of Foundation Stone Ceremony of Vaiseshika Manufacturing Facility.

Dr. Anil Jain (left), President, Vaiseshika is welcoming and garlanding Dr. Jayant Narlikar (right) at Vaiseshika Facility in Ambala Cantt.

Mr. Praveen Jain, (left), Chief Executive, Vaiseshika is presenting a Welcome Bouquet to the Air Chief Marshal A. Y. Tipnis (right) on his arrival at Vaiseshika Facility.

Air Chief Marshal A. Y. Tipnis, Chief of Air Staff, Indian Air Force is inspecting the Guard of Honour at ambala Cantt. at the time of Gian Chand Jain Memorial Lecture on 19th September 2000.

Dr. R. Chidambaram, (centre), Principal Scientific Advisor to the Govt. of India is studying the NIST traceable ISO 17025 compliant calibration certificate of 5000 KGF Morehouse Proving Ring at Vaiseshika Metrology Laboratory on 22nd October 2002.

Dr. Anil Jain (right), President, Vaiseshika is explaining Morehouse Load Cell calibration System to Dr. L. K. Maheshwari (left) Director, Birla Institute of Technology & Science, Pilani at Vaiseshika Facility.

Mr. Yogesh Kumar (right) , Director (LCA), Hindustan Aeronautics Limited, Bangalore is presenting a model of Light Combat Aircraft to Dr. Anil Jain (left) President, Vaiseshika Electron Devices, ambala Cantt on 25th March 2006.

OUR PRESTIGIOUS CLIENTS

LATEST PRODUCTS


AWARDS & HONOURS


NEWS & EVENTS


DIGNITARIES AT VAISESHIKA


OUR ADVANTAGES


  • Hands on training to customers
  • Efficient Service backup
  • World class Calibration Laboratory
  • Highly Qualified Management.

Subscribe to our Product Information Bulletin

Top