Vaiseshika Electron Devices and its Executive Directors have been publishing Research Papers in the Refereed Journals and taking part in National Symposia and Seminars towards augmentation and dissemination of the science of precision measurements and standardization. Here is a list of publications to the credit of Vaiseshika ;

  • S. R. Gowariker and Anil Jain, "Technology transfer between industrial research laboratories and Ambala Scientific Instruments Industry," Electronic education and industrial growth, pp10-11, Sept.1989.
  • Anil Jain, "Technology upgradation through technology transfer from national research laboratories to instrumentation industry," Proceedings of seminar on technology upgradation, Birla Institute of Technology and Science, Pilani (Rajasthan), pp 33-36,Feb1990.
  • Anil Jain, "Instrumentation strides under the stewardship of Dr. S. R. Gowariker, "Trends in instrumentation, industrial technology and science education" pp II 121-23, January 1991, Instrument Society of India, Bangalore and Central Scientific Instruments Organization, Chandigarh.
  • Anil Jain, "On some aspects of technology transfer from national laboratories in India to instrumentation industry : A case study," Ph.D. Thesis, Birla Institute of Technology and Science, Pilani, Rajasthan. 1991.
  • Anil Jain, "Seven years for a good cause," The Tribune, p.07,January 31,1991.
  • Anil Jain, "Interactions between educational institutions and scientific instruments industry," Bulletin of the Indian Association of Physics Teachers, pp42-44, vol.1,no.2, February 1991.
  • Anil Jain, "ISO 14001 : Environmental Standards," Green News, pp11-12, vol.4, March 1998, Guru Jambheshwar University, Hisar.
  • Anil Jain, Calibration and testing of temperature sensors, "Proceedings of the sixth national seminar on physics and technology of sensors", Thapar Institute of Engineering and Technology, Patiala,pp 12.1-2.7, March 4-6,1999.
  • Anil Jain, "Imperative of Metrology and Standardization for Global Trade," IETE Technical Review, pp147-154, vol.17 no. 3, May - June 2000 on 9th April 2000 at the 31st Mid-Term Symposium of the Institution of Electronics and Telecommunication Engineers. (14th Lal.C. Verman Award Lecture)
  • Anil Jain, "Industrial Partnership with BITS, Pilani: the Vaiseshika Experience," IETE Technical Review, pp35-41, vol. 22 no. 1, January- February 2005, Institution of Electronics and Telecommunication Engineers, New Delhi.
  • Anil Jain "Handling the Problems Concerning Quality Management in Small and Medium Enterprises with Special Reference to Asia-Pacific Countries" ICFAI Journal of Science & Technology, pp 112-116, vol.1, no. 1, March 2005.



  • 'Vaiseshika' PCB Inspection Microscope

  • 'Vaiseshika' Digital Image Capturing & Measurement Enabled Display






  • Hands on training to customers
  • Efficient Service backup
  • World class Calibration Laboratory
  • Highly Qualified Management.

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